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John D. Perreault

John D. Perreault

John is a Staff Optical Physicist and has worked on projects within Devices & Services, Google Life Sciences (Verily), and Google[x]. His interests include emerging optics applications, biomedical imaging/microscopy, nanophotonics, 3D computational displays/photography, computer vision/graphics, atomic physics, optical physics, nonlinear optics, quantum mechanics, spectroscopy, holography, Fourier optics, remote sensing, and computational electromagnetics. He has 62 scientific publications, conference presentations, and patents awarded/pending. John earned his B.Sc in Physics and Materials Science from the University of New Hampshire, Ph.D. in Optical Sciences and Physics from the University of Arizona, and held a National Research Council Postdoctoral Fellowship in the Quantum Physics Division at NIST.

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    Multiphoton-Excited Fluorescence of Silicon-Vacancy Color Centers in Diamond
    James Higbie
    Victor Acosta
    Chinmay Belthangady
    Paul Lebel
    Moonhee Kim
    Khoa Nguyen
    Vicky Demas
    Vik Bajaj
    Charles Santori
    Physical Review B (2017)
    Preview abstract Silicon-vacancy color centers in nanodiamonds are promising as fluorescent labels for biological applications, with a narrow, non-bleaching emission line at 738 nm. Two-photon excitation of this fluorescence offers the possibility of low-background detection at significant tissue depth with high three-dimensional spatial resolution. We have measured the two-photon fluorescence cross section of a negatively-charged silicon vacancy (SiV^− ) in ion-implanted bulk diamond to be 0.74(19) × 10^{−50} cm^4 s/photon at an excitation wavelength of 1040 nm. In comparison to the diamond nitrogen vacancy (NV) center, the expected detection threshold of a two-photon excited SiV center is more than an order of magnitude lower, largely due to its much narrower linewidth. We also present measurements of two- and three-photon-excited SiV fluorescence spectra, finding an increase in the two-photon cross section with decreasing wavelength. View details
    Preview abstract Imaging polarimetry is emerging as a powerful tool for remote sensing in space science, Earth science, biology, defense, national security, and industry. Polarimetry provides complementary information about a scene in the visible and infrared wavelengths. For example, surface texture, material composition, and molecular structure will affect the polarization state of reflected, scattered, or emitted light. We demonstrate an imaging polarimeter design that uses three Wollaston prisms, addressing several technical challenges associated with moving remote-sensing platforms. This compact design has no moving polarization elements and separates the polarization components in the pupil (or Fourier) plane, analogous to the way a grating spectrometer works. In addition, this concept enables simultaneous characterization of unpolarized, linear, and circular components of optical polarization. The results from a visible-wavelength prototype of this imaging polarimeter are presented, demonstrating remote sensitivity to material properties. This work enables new remote sensing capabilities and provides a viable design concept for extensions into infrared wavelengths. View details
    Coherent atom-molecule oscillations in a Bose-Fermi mixture
    M. L. Olsen
    T. D. Cumby
    D. S. Jin
    Physical Review A, vol. 80 (2009), 030701(R)
    Matter-Wave Decoherence due to a Gas Environment in an Atom Interferometer
    Hermann Uys
    Alexander D. Cronin
    Physical Review Letters, vol. 95 (2005), pp. 150403
    Using atomic diffraction of Na from material gratings to measure atom-surface interactions
    Alexander D. Cronin
    Physical Review A, vol. 71 (2005), pp. 053612
    Observation of Atom Wave Phase Shifts Induced by Van Der Waals Atom-Surface Interactions
    Alexander D. Cronin
    Physical Review Letters, vol. 95 (2005), pp. 133201